• Chinese Journal of Quantum Electronics
  • Vol. 18, Issue 2, 175 (2001)
[in Chinese]1, [in Chinese]2, [in Chinese]2, and [in Chinese]2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Dynamical Analysis for the Control of In Composition in LP-MOCVD Growth of InGaAlP[J]. Chinese Journal of Quantum Electronics, 2001, 18(2): 175 Copy Citation Text show less

    Abstract

    The dynamicalcharacteristics of the gas flow in Turbo-Disk LP-MOCVD chamber is analysed. The dynamicalpressure model of suppressing In desorption during InGaAlP epitaxial layer grown byLP-MOCVD at high growth temperature around 700 ℃ is presented. The effects of the growth parameters such asthe disk speed and the reaction pressure on In composition in InGaAlP epitaxial layers areexplained based on our model.
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Dynamical Analysis for the Control of In Composition in LP-MOCVD Growth of InGaAlP[J]. Chinese Journal of Quantum Electronics, 2001, 18(2): 175
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