• Frontiers of Optoelectronics
  • Vol. 10, Issue 3, 308 (2017)
Sergey SAVENKOV1、*, Alexander V. PRIEZZHEV2, Yevgen OBEREMOK1, Sergey SHOLOM3, and Ivan KOLOMIETS1
Author Affiliations
  • 1Taras Shevchenko National University of Kyiv, Faculty of Radio Physics, Electronics, and Computer Systems, Vladimirskaya str. 64, 01033 Kiev, Ukraine
  • 2Lomonosov Moscow State University, Department of Physics and International Laser Center, Vorobiovy Gory, 119992 Moscow, Russia
  • 3Oklahoma State University, Department of Physics, 145 Physical Sciences Building, Stillwater, Oklahoma 74078, USA
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    DOI: 10.1007/s12200-017-0727-3 Cite this Article
    Sergey SAVENKOV, Alexander V. PRIEZZHEV, Yevgen OBEREMOK, Sergey SHOLOM, Ivan KOLOMIETS. Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions[J]. Frontiers of Optoelectronics, 2017, 10(3): 308 Copy Citation Text show less
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    Sergey SAVENKOV, Alexander V. PRIEZZHEV, Yevgen OBEREMOK, Sergey SHOLOM, Ivan KOLOMIETS. Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions[J]. Frontiers of Optoelectronics, 2017, 10(3): 308
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