• Frontiers of Optoelectronics
  • Vol. 10, Issue 3, 308 (2017)
Sergey SAVENKOV1、*, Alexander V. PRIEZZHEV2, Yevgen OBEREMOK1, Sergey SHOLOM3, and Ivan KOLOMIETS1
Author Affiliations
  • 1Taras Shevchenko National University of Kyiv, Faculty of Radio Physics, Electronics, and Computer Systems, Vladimirskaya str. 64, 01033 Kiev, Ukraine
  • 2Lomonosov Moscow State University, Department of Physics and International Laser Center, Vorobiovy Gory, 119992 Moscow, Russia
  • 3Oklahoma State University, Department of Physics, 145 Physical Sciences Building, Stillwater, Oklahoma 74078, USA
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    DOI: 10.1007/s12200-017-0727-3 Cite this Article
    Sergey SAVENKOV, Alexander V. PRIEZZHEV, Yevgen OBEREMOK, Sergey SHOLOM, Ivan KOLOMIETS. Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions[J]. Frontiers of Optoelectronics, 2017, 10(3): 308 Copy Citation Text show less

    Abstract

    Mueller matrices were measured for natural (or reference) samples of human nails and samples irradiated by a 2 Gy ionizing radiation dose. The elements of the total Mueller matrix as a function of scattering angle were measured in backscattering mode at a wavelength of 632.8 nm. Several types of depolarizing Mueller matrix decompositions, namely, Ossikovsky, Williams, and Chipman, were calculated as a function of scattering angle for each nail sample. A comparative analysis of the sensitivity of the Mueller matrix decompositions in relation to the problem of emergency dose assessment in nails was performed.<作者简介Sergey Savenkov obtained his Ph.D. and Sc.D. degrees from Taras Shevchenko National University of Kyiv (Ukraine) in 1996 and 2013, respectively. Since 1986, Dr. Savenkov has been a researcher at the Faculty of Radio Physics, Electronics, and Computer Systems, Taras Shevchenko National University of Kyiv (Ukraine). His areas of scientific interest include laser polarimetry, polarimetry of anisotropic and depolarized media, and biomedical optics.
    Sergey SAVENKOV, Alexander V. PRIEZZHEV, Yevgen OBEREMOK, Sergey SHOLOM, Ivan KOLOMIETS. Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions[J]. Frontiers of Optoelectronics, 2017, 10(3): 308
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