• Chinese Journal of Quantum Electronics
  • Vol. 24, Issue 5, 625 (2007)
Yong-fu LI1、*, Hai-feng QI1, Qing-pu WANG1, Xing-yu ZHANG1, Ze-jin LIU2, Yu-rong WANG1, Aijian Wei1, Wei XIA3, and Sa-sa ZHANG1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: Cite this Article
    LI Yong-fu, QI Hai-feng, WANG Qing-pu, ZHANG Xing-yu, LIU Ze-jin, WANG Yu-rong, Wei Aijian, XIA Wei, ZHANG Sa-sa. 532 nm CW laser induced damage of GaAs materials[J]. Chinese Journal of Quantum Electronics, 2007, 24(5): 625 Copy Citation Text show less

    Abstract

    An experiment was designed to study 532 nm CW laser radiation on Si-doped n-type GaAs materials. The crystal axis of GaAs is 〈100〉 leaning to 〈111A〉 15°. As the laser irradiated on the materials,a diffraction-like phenomenon was observed. It was considered as the Fraunhofer diffraction formed by the reflected light from the material surface,and diffraction was developed as a new detecting method of the damage threshold for the first time. A damage threshold power density of GaAs materials,2.56 ×105 W/cm2,was tested experimentally. The heat conduction equation was used to describe the interaction process,and the experimental and theoretical curves of the incident laser power density versus damage threshold time of GaAs were obtained.
    LI Yong-fu, QI Hai-feng, WANG Qing-pu, ZHANG Xing-yu, LIU Ze-jin, WANG Yu-rong, Wei Aijian, XIA Wei, ZHANG Sa-sa. 532 nm CW laser induced damage of GaAs materials[J]. Chinese Journal of Quantum Electronics, 2007, 24(5): 625
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