Author Affiliations
1Center for Terahertz Waves and College of Precision Instrument and Optoelectronics Engineering, Key Laboratory of Opto-electronics Information and Technical Science, Ministry of Education, Tianjin University, Tianjin 300072, China2School of Electrical and Computer Engineering, Oklahoma State University, Stillwater, Oklahoma 74078, USAshow less
Fig. 1. Schematic view of (a) single slit resonator and (b) a pair of slit resonators. (c) Calculated normalized amplitude and (d) phase distributions of the SWs excited by a pair of slit resonators at various θ1 and θ2 (here, LCP incidence was taken as an example).
Fig. 2. (a) Calculated, (c) simulated, and (e) measured V-shaped SW intensity profiles (|Ez|2) rebuilt under LCP incidence, respectively. (b) Calculated, (d) simulated, and (f) measured N-shaped SW intensity profiles (|Ez|2) rebuilt under RCP incidence, respectively. Scale bar: 0.8 mm.
Fig. 3. Simulated spectra and SW field distributions (|Ez|) of (a), (b) slit resonator array, (c), (d) split-ring-shaped slit resonator array, and (e), (f) coupled slit-pair resonator array under the x-polarization incidence, respectively. The insets in the top–left corner represent the corresponding unit elements similarly hereinafter. Scale bar: 1 mm.
Fig. 4. (a)–(e) Simulated and (f)–(j) measured field intensity distributions (|Ez|2) of coupled slit-pair resonator-based metalens with different vertical distances, respectively, under x-polarization incidence. Scale bar: 1 mm.
Fig. 5. (a) Schematic and (b) sample image of the SSR pair; scale bar: 25 μm. The subscript and superscript of A represent the SW propagating direction and SSR number, respectively. (c)–(f) Measured SW field distributions in the case of the x-polarized, y-polarized, LCP, and RCP incidences, respectively. Scale bar: 1 mm.