Author Affiliations
1School of Optoelectronics Engineering, Changchun University of Science and Technology, Changchun, Jilin 130022, China2Key Discipline for National Defense of Space-Ground Laser Communication Technology Laboratory, Changchun University of Science and Technology, Changchun, Jilin 130022, Chinashow less
Fig. 1. (a) Variation in waveform distortion with frequency; (b) ideal rectangular pulse; (c) simulated pulse
Fig. 2. Simulation diagram of bit error rate
Fig. 3. Field laser transmission experiment. (a) Transmitting terminal; (b) atmosphere channel; (c) receiving terminal
Fig. 4. Processing flow for experimental data
Fig. 5. Co-simulation of ISE and modelsim. (a) Register-transfer level schematic of ISE simulation; (b) result of modelsim simulation; (c) relationship between number of w and mean square error; (d) mean square error of real-time data
Fig. 6. Average time waveform of received light pulse intensity. (a) Time waveform of simulated 100 MHz rectangular pulse; (b) average time waveform of transmitting terminal; (c) average time waveform of rectangular pulse laser signal after passing through atmosphere; (d) average time waveform after using channel compensation algorithm
Fig. 7. Frequency-domain envelope of received light pulse intensity. (a) Frequency-domain envelope of simulated 100 MHz rectangular pulse; (b) frequency-domain envelope of transmitting terminal; (c) frequency-domain envelope of rectangular pulse laser signal after passing through atmosphere; (d) frequency-domain envelope after using channel compensation algorithm
Fig. 8. Power spectrum envelope of received light pulse. (a) Power spectrum envelope of simulated 100 MHz rectangular pulse; (b) power spectrum envelope of transmitting terminal; (c) power spectrum envelope of rectangular pulse laser signal after passing through atmosphere; (d) power spectrum envelope after using channel compensation algorithm
Fig. 9. Bit error rate statistic chart of field experiments. (a) BER sample statistic chart; (b) judgment probability of the 10th sample number without compensation; (c) judgment probability of the 10th sample number with compensation, where the 10th sample number is 1.4×107
Target device logic utilization | xc7vx330t-2ffg1157 used | ISE 14.7 available | Number of w is 11 utilization |
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Number of slice registers | 307 | 408000 | 0 | Number of slice LUTs | 2068 | 204000 | 1% | Number of fully used LUT-FF pairs | 83 | 2292 | 3% | Number of bonded IOBs | 50 | 600 | 8% | Number of BUFG/BUFGCTRLs | 2 | 32 | 6% |
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Table 1. Statistics of FPGA internal resource utilization