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Journals >Acta Optica Sinica >Volume 15 >Issue 4 >Page 492 > Article

Acta Optica Sinica
Vol. 15, Issue 4, 492 (1995)

New Design of Angle-Variable Spectroscopic Ellipsometer (RPA type)

[in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. New Design of Angle-Variable Spectroscopic Ellipsometer (RPA type)[J]. Acta Optica Sinica, 1995, 15(4): 492 Copy Citation Text

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CLP Journals

[1] Xu Peng, Liu Tao, Wang Linzi, Li Guoguang, Xiong Wei, Rong Jian. Calibration Method for Single Wavelength Ellipsometry Using Standard Samples[J]. Acta Optica Sinica, 2013, 33(4): 412002

[2] Zhang Rongjun, Lu Weijie, Cai Qingyuan, Yu Xiang, Zhou Weixi, Zheng Yuxiang, Chen Liangyao. Study on Ellipsometric Spectra of Silicon Nanocrystals[J]. Acta Optica Sinica, 2010, 30(7): 1891

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. New Design of Angle-Variable Spectroscopic Ellipsometer (RPA type)[J]. Acta Optica Sinica, 1995, 15(4): 492

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