• Chinese Optics Letters
  • Vol. 7, Issue 10, 967 (2009)
Xiudi Xiao1、2, Guoping Dong1、2, Hongbo He1, Hongji Qi1、3, Zhengxiu Fan1, and Jianda Shao1
Author Affiliations
  • 1Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2Graduate University of Chinese Academy of Sciences, Beijing 100049, China
  • 3Shanghai Daheng Optics and Fine Mechanics Co., Ltd., Shanghai 201800, China
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    DOI: 10.3788/COL20090710.0967 Cite this Article Set citation alerts
    Xiudi Xiao, Guoping Dong, Hongbo He, Hongji Qi, Zhengxiu Fan, Jianda Shao. Optical properties and microstructure of Ta2O5 thin films prepared by oblique angle deposition[J]. Chinese Optics Letters, 2009, 7(10): 967 Copy Citation Text show less
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    Data from CrossRef

    [1] S. Tripathi, S. Maidul Haque, K. Divakar Rao, J. S. Misal, C. Pratap, N. K. Sahoo. Oxygen partial pressure dependent optical properties of glancing angle deposited (GLAD) Ta2O5 films deposited by magnetron sputtering, 1731, 080076(2016).

    [2] Bin Wang, Hong-Ji Qi, Wei Sun, Jun He, Jiao-Ling Zhao, Hu Wang, Yong-Qiang Hou. Homogeneity analysis of sculptured thin films deposited in symmetric style through glancing angle deposition technique. Chinese Physics B, 23, 117801(2014).

    [3] Jung Woo Leem, Jae Su Yu. Influence of oblique-angle sputtered transparent conducting oxides on performance of Si-based thin film solar cells. physica status solidi (a), 208, 2220(2011).

    Xiudi Xiao, Guoping Dong, Hongbo He, Hongji Qi, Zhengxiu Fan, Jianda Shao. Optical properties and microstructure of Ta2O5 thin films prepared by oblique angle deposition[J]. Chinese Optics Letters, 2009, 7(10): 967
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