Elimination of Interference in the Determination of Selenium in High Purity Tellurium by HG-AFS

MA Ming-yang; SU Liu-kun

doi:10.3964/j.issn.1000-0593(2011)11-3123-03

Journals >Spectroscopy and Spectral Analysis >Volume 31 >Issue 11 >Page 3123 > Article

Spectroscopy and Spectral Analysis
Vol. 31, Issue 11, 3123 (2011)

Elimination of Interference in the Determination of Selenium in High Purity Tellurium by HG-AFS

MA Ming-yang^* and SU Liu-kun

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[in Chinese]

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DOI: 10.3964/j.issn.1000-0593(2011)11-3123-03 Cite this Article

MA Ming-yang, SU Liu-kun. Elimination of Interference in the Determination of Selenium in High Purity Tellurium by HG-AFS[J]. Spectroscopy and Spectral Analysis, 2011, 31(11): 3123 Copy Citation Text

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References

[1] Pridachin D N, Yakushev M V, Sidorov Yu G, et al. Applied Surface Science, 1999, 142(14): 485.

[2] Engelhard T, Jones E D, Viney I, et al. Thin Solid Films, 2000, 370(12): 101.

[3] Munirathnam N R, Prasad D S, Sudheer C, et al. Journal of Crystal Growth, 2003, 254(3): 266.

MA Ming-yang, SU Liu-kun. Elimination of Interference in the Determination of Selenium in High Purity Tellurium by HG-AFS[J]. Spectroscopy and Spectral Analysis, 2011, 31(11): 3123

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