[1] Cai Hongkun, Tao Ke, Wang Linshen et al.. Interface treatment of amorphous silicon thin film solar cells on flexible substrate[J]. Acta Physica Sinica, 2009, 58(11): 7921~7925
[2] R. Alieva, R. G. Ikramovb, O. T. Ismanovab et al.. A semiempirical equation for temperature dependences of photoelectric parameters of a-SiH solar cells[J]. Appl. Solar Energy, 2011, 47(1): 52~55
[3] Li Shibin, Wu Zhiming, Yuan Kai et al.. Study on thermal conductivity of hydrogenated amorphous silicon films[J]. Acta Physica Sinica, 2008, 57(5): 3126~3131
[4] I. A. Kurova, N. N. Dvmont. Specific features of recombination in layered a-SiH films [J]. Semiconductors, 2012, 46(3): 315~318
[5] J. L. Tissot. 160×120 uncooled amorphous silicon TEC-less detector with 25 μm pixel-pitch[J]. J. Applied Optics, 2007, 28(1): 1~6
[6] Zhou Yi, Wang Aiying. Determination of optical constants and thickness of diamond like carbon films by a multiple sample method[J]. Acta Optica Sinica, 2010, 30(8): 2467~2472
[7] Guo Chun, Lin Dawei, Zhang Yundong et al.. Determination of optical constants of LaF3 films from spectrophotometric measurements[J]. Acta Optica Sinica, 2011, 31(7): 0731001
[8] Liang Liping, Hao Jianying, Qin Mei et al.. Determination of the optical constants of sol-gel derived ZrO2 films simply from the transmission spectra[J]. Acta Physica Sinica, 2008, 57(12): 7906~7911
[9] M. Kar, B. S. Verma. Improvements in the determination of extinction coefficients of a thin film using an envelope method[J]. J. Opt. A: Pure Appl. Opt., 2005, 7(10): 599~603
[10] E. R. Shaaban. Calculation of the optical constants of amorphous semiconducting As40S60, As40S35Se25 and As40Se60 thin film from transmittance and reflectance measurements[J]. J. Appl. Sci., 2006, 6(2): 340~346
[11] M. Kar. Error minimization in the envelope method for the determination of optical constants of a thin film[J]. Surf. Interface Anal., 2010, 42(3): 145~150
[12] A. P. Caricato, A. Fazzi, G. Leggieri. A computer program for determination of thin films thickness and optical constants[J]. Appl. Surf. Sci., 2005, 248(1-4): 440~445
[13] R. Swanepoel. Determination of surface roughness and optical constants of inhomogeneous amorphous silicon films[J]. J. Phys. E: Sci. Instrum., 1984, 17(10): 896~903
[14] Z. Yin, H. S. Tan, F. W. Smith. Determination of the optical constants of diamond films with a rough growth surface[J]. Diam. Relat. Mater., 1996, 5(12): 1490~1496