• Journal of Infrared and Millimeter Waves
  • Vol. 40, Issue 4, 459 (2021)
Chao WANG1、2, Yao YAO1, Zheng-Ji WEN1、2, Jia-Ming HAO1、*, Gu-Jin HU3、*, and Ning DAI1、4、5
Author Affiliations
  • 1State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
  • 3Department of Physics, College of Mathematics and Science, Shanghai Normal University, Shanghai 200234, China
  • 4College of Physics and Optoelectronic Engineering, Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, Hangzhou 310024, China
  • 5Jiangsu Collaborative Innovation Center of Photovolatic Science and Engineering, Changzhou 213164, China
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    DOI: 10.11972/j.issn.1001-9014.2021.04.004 Cite this Article
    Chao WANG, Yao YAO, Zheng-Ji WEN, Jia-Ming HAO, Gu-Jin HU, Ning DAI. Antireflection coating for epitaxial blocked impurity band detector[J]. Journal of Infrared and Millimeter Waves, 2021, 40(4): 459 Copy Citation Text show less

    Abstract

    When an infrared wave is incident on the traditional epitaxial blocked impurity band detector, part of wave energy would be reflected by the device due to its special structural design and the properties of the constituent materials. The energy loss is obviously detrimental to the performance of the device. Here, a kind of bilayer metasurface-based microstructure array is introduced into the epitaxial blocked impurity band infrared detector for suppression of reflection. Experimental results show that the reflectance of the proposed metasurface-based device is lower than 20% in the wavelength range of 25.3~32.2 μm, particularly, which is even less than 3% at the wavelength of 30 μm. Meanwhile, the proposed metasurface antireflection coating also has strong polarization selectivity for incident wave, which meets the requirement for the fourth-generation focal plane arrays development.
    Chao WANG, Yao YAO, Zheng-Ji WEN, Jia-Ming HAO, Gu-Jin HU, Ning DAI. Antireflection coating for epitaxial blocked impurity band detector[J]. Journal of Infrared and Millimeter Waves, 2021, 40(4): 459
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