Research on Spectral Characteristic of Miniature X-Ray Tube and Determination of Beryllium Window Thickness

GU Yi; XIONG Sheng-qing; GE Liang-quan; FAN Zheng-guo; ZHANG Qing-xian; ZHU Zhen-ya

doi:10.3964/j.issn.1000-0593(2014)01-0252-05

Journals >Spectroscopy and Spectral Analysis >Volume 34 >Issue 1 >Page 252 > Article

Spectroscopy and Spectral Analysis
Vol. 34, Issue 1, 252 (2014)

Research on Spectral Characteristic of Miniature X-Ray Tube and Determination of Beryllium Window Thickness

GU Yi^{1、2、3、*}, XIONG Sheng-qing¹, GE Liang-quan³, FAN Zheng-guo¹, ZHANG Qing-xian³, and ZHU Zhen-ya⁴

Author Affiliations

¹[in Chinese]

²[in Chinese]

³[in Chinese]

⁴[in Chinese]

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DOI: 10.3964/j.issn.1000-0593(2014)01-0252-05 Cite this Article

GU Yi, XIONG Sheng-qing, GE Liang-quan, FAN Zheng-guo, ZHANG Qing-xian, ZHU Zhen-ya. Research on Spectral Characteristic of Miniature X-Ray Tube and Determination of Beryllium Window Thickness[J]. Spectroscopy and Spectral Analysis, 2014, 34(1): 252 Copy Citation Text

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References

[5] Moxtek, Inc. Mobile Miniature X-Ray Source. United States, 2002, Patent No: US6661876B2.

[6] Pells P A, Feng Liangyuan, Small J A. X-Ray Spectrometry, 1985, 14(3): 125.

[8] West M, Ellis A T, Potts P J, et al. Journal of Analytical Atomic Spectrometry, 2011, 26: 1919.

[9] Lemberge K, Van Espen P J, Vrebos B. X-Ray Spectrometry, 2000, 29: 297.

[11] Cesareo R, Brunetti A, Castllano A, et al. Portable Equipment for X-ray Fluorescence Analysis∥Tsuji K, Injuk J, van Grieken R. X-Ray Spectrometry: Recent Technological Advances. John Wiley & Sons, 2004. 30.

[12] Kulshreshtha S K, Wagh D N, Bajpei H N. X-Ray Spectrometry, 2005, 34: 200.

[13] Willis J P, Lachance G L. X-Ray Spectrometry, 2004, 33: 181.

[14] Harada M, Sakurai K. Spectrochim Acta B, 1999, 54: 29.

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