Zhenghe Zhang, Zhen Huang, Ruting Chen, Xiaohui Xue, Chunhui Yan, Hengfeng Huang, and Dongyu Li*
Author Affiliations
School of Physics Science and Technology, Lingnan Normal University, Zhanjiang, Guangdong 524048, Chinashow less
Fig. 1. Schematic of projective background-oriented schlieren apparatus
Fig. 2. Offset of light generated after flow field measurement
Fig. 3. Refractive index distribution function and projection
Fig. 4. Flow chart of proposed algorithm
Fig. 5. Results for each process. (a) Image capture; (b) image filter; (c) correlation analysis; (d) temperature field reconstruction
Fig. 6. Correlation analysis of images. (a) Correlation function; (b) schematic of correlation analysis process; (c) offset of particles in x-axis direction; (d) offset of particles in y-axis direction
Fig. 7. Offset of particles in x-axis direction. (a) Flame tip interception at moment 1; (b) flame tip interception at moment 2; (c) offset of particles in x-axis direction
Fig. 8. Photograph of measurement instrument
Fig. 9. Flame tip interception
Fig. 10. Comparison among flame tip interceptions at different moments. (a) Moment 1; (b) moment 2
Fig. 11. Particle offset. (a) x-axis; (b) y-axis
Fig. 12. Refractive index gradient at flame tip
Fig. 13. Refractive index at flame tip
Fig. 14. Density gradient at flame tip
Fig. 15. Density at flame tip
Fig. 16. 3D reconstruction of temperature field at flame tip
Fig. 17. Temperature distribution on tangent surface at flame tip