• Opto-Electronic Engineering
  • Vol. 38, Issue 6, 110 (2011)
ZHANG Qiu-jia1、*, ZHAO Yu-hua1, HAN Dong2, YU Ping1, and LIU Ming-zhu1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2011.06.019 Cite this Article
    ZHANG Qiu-jia, ZHAO Yu-hua, HAN Dong, YU Ping, LIU Ming-zhu. On-line Measurement of Surface Roughness Based on Laser Two-dimensional Scattering Principle[J]. Opto-Electronic Engineering, 2011, 38(6): 110 Copy Citation Text show less
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    [3] WANG Ming-jun, DONG Yan-bin, WU Zhen-shen, et al. Research on light scattering characteristics of rough surface and optical constants deduction [J]. Infrared and Laser Engineering, 2002, 10(1): 45-49.

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    [7] WANG Ying-long, ZHANG Rong-mei, FU Guang-sheng, et al. Influence of inert gas pressure on the surface roughness of silicon film prepared by pulsed laser deposition [J]. Chinese J.Lasers, 2004, 31(6): 698-700.

    [8] YU Yong-hui, TU Qiao-ling, XU Xia, et al. Design of High-Speed Data Acquisition System Based on USB2.0 and Linear CCD [J]. Piezoelectrics & Acoustooptics, 2009, 31(3): 448-450.

    [9] LIU Wei-ming, HE Yong-yi, LI Jing, et al. H igh-speed Surface RoughnessM easuring System Based on USB2. 0[J]. Instrument Technique and Sensor, 2008, (2): 53-55.

    [10] DU Yan-li, YANG Jing, YAN Hui-min. New Data Processing Method of Two-path Differential White Light Interference Spectrum [J]. Opto-Electronic Engineering, 2009, 36(5): 140-144.

    ZHANG Qiu-jia, ZHAO Yu-hua, HAN Dong, YU Ping, LIU Ming-zhu. On-line Measurement of Surface Roughness Based on Laser Two-dimensional Scattering Principle[J]. Opto-Electronic Engineering, 2011, 38(6): 110
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