• Optoelectronic Technology
  • Vol. 44, Issue 2, 102 (2024)
Wei WANG1,2, Nailong HE1,3, Yuning ZHANG1, Ran WEI1, and Xiaoyu HUANG1
Author Affiliations
  • 1School of Electronic Science and Engineering, Southeast University, Nanjing 20096, CHN
  • 2Military Representative Office in Wuxi Region, Army Equipment Department,Wuxi Jiangsu 14000, CHN
  • 3Shi Cheng Laboratory for Information Display and Visualization, Nanjing 210008, CHN
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    DOI: 10.12450/j.gdzjs.202402004 Cite this Article
    Wei WANG, Nailong HE, Yuning ZHANG, Ran WEI, Xiaoyu HUANG. Near⁃eye Display Critical Optical Performance Test System Based on CMOS Camera[J]. Optoelectronic Technology, 2024, 44(2): 102 Copy Citation Text show less
    Schematic of imaging and testing principle of NED device
    Fig. 1. Schematic of imaging and testing principle of NED device
    2×2 black and white grid test diagram for distortion measurement
    Fig. 2. 2×2 black and white grid test diagram for distortion measurement
    Diagram of system calibration measurement
    Fig. 3. Diagram of system calibration measurement
    The hardware construction renderings of the designed NED equipment measurement system
    Fig. 4. The hardware construction renderings of the designed NED equipment measurement system
    Measurement diagram of the system
    Fig. 5. Measurement diagram of the system
    Wei WANG, Nailong HE, Yuning ZHANG, Ran WEI, Xiaoyu HUANG. Near⁃eye Display Critical Optical Performance Test System Based on CMOS Camera[J]. Optoelectronic Technology, 2024, 44(2): 102
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