Wei WANG, Nailong HE, Yuning ZHANG, Ran WEI, Xiaoyu HUANG. Near⁃eye Display Critical Optical Performance Test System Based on CMOS Camera[J]. Optoelectronic Technology, 2024, 44(2): 102

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- Optoelectronic Technology
- Vol. 44, Issue 2, 102 (2024)

Fig. 1. Schematic of imaging and testing principle of NED device

Fig. 2. 2×2 black and white grid test diagram for distortion measurement

Fig. 3. Diagram of system calibration measurement

Fig. 4. The hardware construction renderings of the designed NED equipment measurement system

Fig. 5. Measurement diagram of the system

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