A near-eye display （NED） test equipment based on binocular CMOS camera was developed， and a technique for measuring the primary optical properties was presented. Fast and low-cost measurement of NED device optical properties was accomplished via derivation modeling， system design， and calibration tests in accordance with important NED optics principles. The final experiment demonstrated that this test system could save around 60% of the measurement time compared to the previous technique， with a key parameter test error of less than 5%.