• Journal of Infrared and Millimeter Waves
  • Vol. 29, Issue 3, 161 (2010)
CHU Kai-Hui, ZHANG Wen-Jing, XU Jin-Tong, and LI Xiang-Yang
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  • [in Chinese]
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    CHU Kai-Hui, ZHANG Wen-Jing, XU Jin-Tong, LI Xiang-Yang. ANOMALOUS CAPACITANCE OF GaN-BASED SCHOTTKY DIODES[J]. Journal of Infrared and Millimeter Waves, 2010, 29(3): 161 Copy Citation Text show less
    References

    [1] Raaeghi M, Rofalski A. Semiconductor ultraviolet detectors[J]. J. Appl. Phys.1996,79(10):7433-7473.

    [2] Monroy E, Calle F and Pau J L, et al. Analysis and modeling of AlxGa1-xN-based Schottky barrier photodiodes[J]. J. Appl. Phys.2000,88(4):2081-2091.

    [3] Card H C, Rhoderick E H. Studies of tunnel MOS diodesⅠ: Interface effects in silicon Schottky diodes[J]. J. Phys. D,1971,3:1589-1601.

    [4] Sze, S M. Semiconductor Devices[C], second ed. New York: John Wiley & Sons;1981.

    [5] Rhoderick E H. Metal-Semiconductor Contacts[C]. Oxford: Claredon; 1978.

    [6] Wang R X, Xu S J, Shi S L, et al. Probing deep level centers in GaN epilayers with variable-frequency capacitance-voltage characteristics of Au/GaN Schottky contacts[J]. Appl. Phys. Lett.,2006,89(14):143505-1-143505-3.

    [7] Franssen G, Plesiewicz J A, Dmowski L H, et al. Hydrostatic pressure dependence of polarization-induced interface charge in AlGaN/GaN heterostructure determination by means of capacitance-voltege characteristion[J]. J. Appl. Phys.,2006,100(11):113712-1-113712-6.

    [8] Wu X, Yang E S, Evans H L. Negative capacitance at metal-semiconductor interfaces[J]. J. Appl. Phys.,1990,68(6):2845-2848.

    [9] Ho P S, Yang E S, Evans H L, et al. Electronics states at Silicide-Silicon interfaces[J]. Phys. Rev. Lett.,1986,56(2):177-180.

    [10] Werner J, Levi A F J, Tung R T, et al. Origion of excess capacitance at intimate schottky contacts[J]. Phys. Rev. Lett.,1988,60(1):53-56.

    [11] Champness C H, Clark W R. Anomalous inductive effect in selenium Schottky diodes[J]. Appl. Phys. Lett.,1990,56(12):1104-1106.

    [12] Muret P, Elguennouni D, Missous M, et al. Admittance of Al/GaAs Schottky contacts under forward bias as a function of interface preparation conditions[J]. Appl. Phys. Lett.,1991,58(2):155-157.

    [13] Cheung S K, Cheung N W. Extraction of Schottky diodes parameters from forward current-voltege characteristics[J]. Appl. Phys. Lett.,1986,49(2):85-87.

    [14] Chattopadhyay P, Raychaudhuri B. New technique for the determination of series resistance of Schottky barrier diodes[J]. Solid-State Electron,1992,35(4):1023-1024.

    [15] Shen X M, Zhao D G, Liu Z S, et al. Spaced-charge-limited currents in GaN Schottky diodes[J]. Solid-State Electron,2005,49:847-852.

    CHU Kai-Hui, ZHANG Wen-Jing, XU Jin-Tong, LI Xiang-Yang. ANOMALOUS CAPACITANCE OF GaN-BASED SCHOTTKY DIODES[J]. Journal of Infrared and Millimeter Waves, 2010, 29(3): 161
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