[1] Per W Schmidt. NRL hybrid reliability physics of failure initial study[R]. ADA217986, 1990.
[2] John W Marciniec. Hybrid PV HgCdTe IR detectors technology reliability and failure physics program-environmental stress testing plan[R]. ADA191l65, 1987.
[3] Rolin K. Asatourian. Infrared focal plane array storage life assessment by accelerated aging[J]. Quality and Reliability Engng Int, 1998, 14: 425-432.
[4] Xavier Breniere, Philippe Tribolet. IR detectors design and approach for tactical applications with high reliability without maintenance[C]//SPIE, 2008, 6940: 69400H-1-13.
[5] Pieruschka E. Relation between lifetime distribution and the stress level [R]. LMSD-400800, Sunnyvale, California: Lockheed Missile and Space Division, 1961.
[6] Nelson W. Accelerated Testing: Statistical Methods, Test Plans, and Data Analysis [M]. New York: John Wiley Press, 1990.
[7] Hou Zhijin, Fu Li, Wang Wei, et al. Study on connected defective elements in focal plane array identification by response and crosstalk[J]. Infrared and Laser Engineering, 2017, 46(4): 0420002. (in Chinese)
[8] Hao Lichao, Huang Aibo, Lai Canxiong, et al. Discussion of reliability analysis on IRFPAs by bad pixel[J]. Infrared and Laser Engineering, 2016, 45(5): 0504004. (in Chinese)
[9] Wang Wei, Fan Yangyu, Si Junjie, et al. Types and determination of bad pixels in IRFPA[J]. Infrared and Laser Engineering, 2012, 41(9): 2261-2264. (in Chinese)
[11] Antoni Rogalski. Infrared Detectors[M]. 2nd ed. Zhou Haixian, Cheng Yunfang, translated. Beijing: China Machine Press, 2014: 641, 406, 369. (in Chinese)
[12] Chen Xing. Research on the related technology of HgCdTe infrared focal plane detector reliability[D]. Shanghai: Shanghai Institute of Techcial Physics, Chinese Academy of Sciences, 2014: 12. (in Chinese)
[13] Zhang Wenwei, Li Hongmin. Induction treatment of environmental profile of natural storage station[J]. Equipment Environmental Engineering, 2011, 8(1): 61-81. (in Chinese)
[14] Nitz H M, Ganschow O, Kaiser U, et al. Quasi-simultaneous SIMS, AES, XPS, and TDMS study of preferntial sputtering, diffusion, and mercury evaporation in CdxHg1-xTe[J]. Surface Science, 1981, 104(2/3): 365-383.
[15] Mestechkin A, Lee D L, Cunningham B T, et al. Bake stability of long-wavelength infrared HgCdTe photodiodes [J]. Journal of Electronic Materials, 1995, 24: 1183-1187.
[16] Jiang Renyuan, Zhang Xingtang, Yang Yichun. Study on accelerated life test of function degenerating type by temperature stress[J]. Journal of Nanjing University of Science and Technology, 2000, 24(6): 523-527. (in Chinese)
[17] Yurkowsky W, Schafter R E, Finkelstein J M. Accelerated testing technology. Technical Report No. RADC-TR-67-420[R]. Rome Air Development Center, 1967.
[18] Deng Aimin, Chen Xun, Zhang Chunhua, et al. Reliability assessment based on performance degradation data[J]. Journal of Astronautics, 2006, 27(3): 546-552. (in Chinese)
