• Chinese Journal of Quantum Electronics
  • Vol. 41, Issue 4, 649 (2024)
ZUO Lingyun, SHI Haosen, YAO Yuan, JIANG Yanyi, and MA Longsheng
Author Affiliations
  • State Key Laboratory of Precision Spectroscopy, East China Normal University, Shanghai 200241, China
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    DOI: 10.3969/j.issn.1007-5461.2024.04.009 Cite this Article
    Lingyun ZUO, Haosen SHI, Yuan YAO, Yanyi JIANG, Longsheng MA. Background noise analysis of laser interferometer for test of TDI technology on ground[J]. Chinese Journal of Quantum Electronics, 2024, 41(4): 649 Copy Citation Text show less
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    Lingyun ZUO, Haosen SHI, Yuan YAO, Yanyi JIANG, Longsheng MA. Background noise analysis of laser interferometer for test of TDI technology on ground[J]. Chinese Journal of Quantum Electronics, 2024, 41(4): 649
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