• Acta Optica Sinica
  • Vol. 10, Issue 4, 369 (1990)
[in Chinese] and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese]. Measurement of thermal expansion coefficients of optical thin films[J]. Acta Optica Sinica, 1990, 10(4): 369 Copy Citation Text show less

    Abstract

    Thermal expansion coefficients of optical the films can be measured by means of the combination of photothermal displacement optical team deflection technique and transverse photothermal dcffection technique. In this paper, single layers of SiO2, TiO2, ZrO2, MgF2 and ThF4 are taken as examples to show the experimental methods and results.
    [in Chinese], [in Chinese]. Measurement of thermal expansion coefficients of optical thin films[J]. Acta Optica Sinica, 1990, 10(4): 369
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