• Infrared and Laser Engineering
  • Vol. 34, Issue 2, 221 (2005)
[in Chinese]*, [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Denoising method based on translation invariant and generalized cross validation[J]. Infrared and Laser Engineering, 2005, 34(2): 221 Copy Citation Text show less
    References

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    [2] Donoho D L, Johnstone I M. Adapting to unknown smoothness via wavelet shrinkage[J].J Amer Statistic Assoc,1995,90:1200-1224.

    [3] Nason G P.Wavelet shrinkage using cross validation[J].Journal of the Royal Statistical Society,Series B,1996,58:463-479.

    [4] Weyrich N, Warhola G T.Wavelet shrinkage and generalized cross validation for image denoising[J].IEEE Trans on Image Processing,1998,7(1):82-90.

    [5] Jansen M, Bultheel A.Multiple wavelet threshold estimation by generalized cross validation for images with correlated noise[J].IEEE Trans on Image Processing,1999,8(7):947-953.

    [6] Zhang Xiao-ping,Desai M D.Adaptive denoising based on SURE risk[J].IEEE Signal Processing Letters, 1998,5(10):265-267.

    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Denoising method based on translation invariant and generalized cross validation[J]. Infrared and Laser Engineering, 2005, 34(2): 221
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