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Journals >Acta Optica Sinica >Volume 13 >Issue 11 >Page 1040 > Article

Acta Optica Sinica
Vol. 13, Issue 11, 1040 (1993)

Automatic processing of interferogram from surface roughness measuring interferometer

[in Chinese] and [in Chinese]

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[in Chinese], [in Chinese]. Automatic processing of interferogram from surface roughness measuring interferometer[J]. Acta Optica Sinica, 1993, 13(11): 1040 Copy Citation Text

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Abstract

Computer-based processing of interferogram of surface roughness measuring interferometer are introduced in the paper, in which threshold segmenting of brightness are used for binary image processing and border following for edge curve sampling.

Keywords

image processing surface roughness interferometry

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[in Chinese], [in Chinese]. Automatic processing of interferogram from surface roughness measuring interferometer[J]. Acta Optica Sinica, 1993, 13(11): 1040

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