Microscanning Reconstruction Algorithm for IR Imaging System

WANG Xue-wei; LI Ke; WANG Shi-li

doi:10.3969/j.issn.1003-501x.2012.12.020

Journals >Opto-Electronic Engineering >Volume 39 >Issue 12 >Page 122 > Article

Opto-Electronic Engineering
Vol. 39, Issue 12, 122 (2012)

Microscanning Reconstruction Algorithm for IR Imaging System

WANG Xue-wei^*, LI Ke, and WANG Shi-li

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[in Chinese]

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DOI: 10.3969/j.issn.1003-501x.2012.12.020 Cite this Article

WANG Xue-wei, LI Ke, WANG Shi-li. Microscanning Reconstruction Algorithm for IR Imaging System[J]. Opto-Electronic Engineering, 2012, 39(12): 122 Copy Citation Text

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References

[2] Stadmiller T，Gillette J，Hardie R. Reduction of aliasing in staring infrared imagers utilizing sub-pixel techniques [J]. Proc of the IEEE(S0018-9219)，1995，2: 874-880.

[4] John L M，John W. Benefits of microscan for staring infrared imagers [J]. Proc. of SPIE(S0277-786X)，2004，5407: 127-138.

WANG Xue-wei, LI Ke, WANG Shi-li. Microscanning Reconstruction Algorithm for IR Imaging System[J]. Opto-Electronic Engineering, 2012, 39(12): 122

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