• Opto-Electronic Engineering
  • Vol. 39, Issue 2, 74 (2012)
ZHOU Chong*, WANG Hui, LI Yong, and BAI Xiao-hui
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2012.02.015 Cite this Article
    ZHOU Chong, WANG Hui, LI Yong, BAI Xiao-hui. There-dimensional Surface Full Color Imaging of Microstructure by Fourier Transform[J]. Opto-Electronic Engineering, 2012, 39(2): 74 Copy Citation Text show less

    Abstract

    Analysis show that spectral information and three-dimensional shape structure data are both contained in Fourier transform imaging spectrometer’s interference signal. A new method of three-dimensional color shape measurement is proposed, which could measure spectral reflectance of each point on sample surface and three-dimensional shape data of sample, and then achieve the three-dimensional surface hyperspectral imaging. According to the texture mapping, three-dimensional data could be reconstructed in full-color about the microstructure colored-object. Experimental results demonstrate that the proposed method is effective.
    ZHOU Chong, WANG Hui, LI Yong, BAI Xiao-hui. There-dimensional Surface Full Color Imaging of Microstructure by Fourier Transform[J]. Opto-Electronic Engineering, 2012, 39(2): 74
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