• Infrared and Laser Engineering
  • Vol. 34, Issue 3, 292 (2005)
[in Chinese]*, [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Multi-view modeling of 3-D target based on Zernike moments[J]. Infrared and Laser Engineering, 2005, 34(3): 292 Copy Citation Text show less
    References

    [1] Ziv Gigus,Jitendra Malik. Computing the aspect graph for line drawing of polyhedral objects[J].IEEE Transactions on Pattern Analysis and Machine Intelligence, 1996,12(2): 113-122.

    [2] A1-Rawi Mohammed, Yang Jie. Practical fast computation of Zernike moments[J].J Comput Sci & Technol,2002,17(2):181-188.

    [3] Simon X Liao, Miroslaw Pawlak. On the accuracy of Zernike moments for image analysis[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 1998,20(12):1358-1364.

    [5] Alireza Khotanzad, Yaw Hua Hong.Invariant image recognition by Zernike Moments[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 1990,12 (5) :489-497.

    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Multi-view modeling of 3-D target based on Zernike moments[J]. Infrared and Laser Engineering, 2005, 34(3): 292
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