• Infrared and Laser Engineering
  • Vol. 48, Issue 3, 306002 (2019)
Zhou Xuanfeng*, Chen Qianrong, Wang Yanbin, Zhu Rongzhen..., Li Hua and Ren Guangsen|Show fewer author(s)
Author Affiliations
  • [in Chinese]
  • show less
    DOI: 10.3788/irla201948.0306002 Cite this Article
    Zhou Xuanfeng, Chen Qianrong, Wang Yanbin, Zhu Rongzhen, Li Hua, Ren Guangsen. Image interrupt effect and mechanism of pulse laser irradiated CMOS camera[J]. Infrared and Laser Engineering, 2019, 48(3): 306002 Copy Citation Text show less
    References

    [1] Kazuya Yonemoto. CCD/CMOS Image Sensor no Kiso to Ouyou[M]. Chen Rongting, Transl. Beijing: Science Press, 2006: 6-10. (in Chinese)

    [2] Jiang Wenjie, Zeng Xuewen, Shi Jianhua. Photoelectric Technology[M]. Beijing: Science Press, 2009: 219-223. (in Chinese)

    [3] Wang Qingyou. Application Technology of Image Sensor[M]. Beijing: Electronic Industry Press, 2013: 157-170. (in Chinese)

    [4] Li Jijun, Du Yungang, Zhang Lihua, et al. Research progress on CMOS image sensors[J]. Laser & Optoelectronics Progress, 2009, 46(4): 45-52. (in Chinese)

    [5] Shao Ming, Zhang Leilei, Zhao Wei, et al. Experiment study on saturation effect of high-repetition-rate laser jamming CMOS camera[J]. Laser Journal, 2013, 34(2): 16-17. (in Chinese)

    [6] Wang Ang. Research on the irradiation effects of CMOS image sensor under laser[D]. Changsha: National University of Defense Technology, 2014: 11-43. (in Chinese)

    [7] Wang Ang, Guo Feng, Zhu Zhiwu, et al. Comparative study of hard CMOS damage irradiated by CW laser and single-pulse ns laser[J]. High Power Laser and Particle Beams, 2014, 26(9): 43-47. (in Chinese)

    [8] Guo Feng, Zhu Rongzhen, Wang Ang, et al. Damage effect on CMOS detector irradiated by single-pulse laser[C]// International Symposium on Photoelectronic Detection and Imaging, Proc of SPIE, 2013, 8905: 890521.

    [9] Wang Jingnan, Nie Jinsong. Experimental study on supercontinuum laser irradiating a visible light CMOS imaging sensor[J]. Infrared and Laser Engineering, 2017, 46(1): 0106004. (in Chinese)

    [10] Lai Liping, Fu Bo, Zhang Rongzhu. Effect of broadband sources on electrical crosstalk of CMOS array[J]. Infrared and Laser Engineering, 2017, 46(1): 0120005. (in Chinese)

    [11] Guo Feng. Comparative study on the irradiation effect of the laser to CMOS and CCD[D]. Changsha: National University of Defense Technology, 2013: 17-26. (in Chinese)

    [12] Shao Ming, Zhang Le, Zhang Leilei, et al. Comparative study saturation effect of 1.06 μm laser jamming CCD and CMOS cameras[J]. Journal of Applied Optics, 2014, 35(1): 163-167. (in Chinese)

    [13] Sheng Liang, Zhang Zhen, Zhang Jianmin, et al. Pixel upset effect and mechanism of CW laser irradiated CMOS camera[J]. Infrared and Laser Engineering, 2016, 45(6): 0606004. (in Chinese)

    [14] Liu Hailong, Li Xiangzhi, Xue Xucheng, et al. Vibration parameter detection of space camera by taking advantage of CMOS self-correlation Imaging of plane array of roller shutter[J]. Optics and Precision Engineering, 2016, 24(6): 1474-1481. (in Chinese)

    Zhou Xuanfeng, Chen Qianrong, Wang Yanbin, Zhu Rongzhen, Li Hua, Ren Guangsen. Image interrupt effect and mechanism of pulse laser irradiated CMOS camera[J]. Infrared and Laser Engineering, 2019, 48(3): 306002
    Download Citation