• Acta Optica Sinica
  • Vol. 35, Issue 4, 416004 (2015)
Liu Fengfang*, Zhu Zhaojie, and Tong Yuanwei
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/aos201535.0416004 Cite this Article Set citation alerts
    Liu Fengfang, Zhu Zhaojie, Tong Yuanwei. Effects on Imaging Quality of Defects in the Photonic Crystal with Negative Refraciton Material[J]. Acta Optica Sinica, 2015, 35(4): 416004 Copy Citation Text show less

    Abstract

    Silicon columns are arranged periodically to constitute a photonic crystal slab with hexagonal structure in the air medium, and different configurations of defects are introduced in the photonic crystal slab. The effects on imaging quality are mainly discussed by changing the radius of the defect dielectric column and the center position of defects. Through the method of finite difference time domain, simulation results show that the change of dielectric column radius and the position of defects can increase the transmittance of light and enhance the image intensity. Due to the introduction of defects, the interference between the defects can reduce the resolution of the imaging.
    Liu Fengfang, Zhu Zhaojie, Tong Yuanwei. Effects on Imaging Quality of Defects in the Photonic Crystal with Negative Refraciton Material[J]. Acta Optica Sinica, 2015, 35(4): 416004
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