Detection of Residual Organic Pesticides in Yam by Surface Enhanced Raman Spectroscopy

Lei Liu; Zhenglan Bian; Zuoren Dong; Fenghong Chu; Yuanhang Wang; Jinglin Li; Lu Zhang

doi:10.3788/LOP202259.0417001

Journals >Laser & Optoelectronics Progress >Volume 59 >Issue 4 >Page 0417001 > Article

Laser & Optoelectronics Progress
Vol. 59, Issue 4, 0417001 (2022)

Detection of Residual Organic Pesticides in Yam by Surface Enhanced Raman Spectroscopy

Lei Liu^1、2, Zhenglan Bian^1、*, Zuoren Dong^2、**, Fenghong Chu¹, Yuanhang Wang³, Jinglin Li¹, and Lu Zhang¹

Author Affiliations

¹College of Electronics and Information Engineering, Shanghai University of Electric Power, Shanghai 201306, China

²Key Laboratory of Space Laser Communication and Detection Technology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

³Information Optics and Optoelectronic Technology Laboratory, Shanghai Institute of Optics and Compact Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

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DOI: 10.3788/LOP202259.0417001 Cite this Article Set citation alerts

Lei Liu, Zhenglan Bian, Zuoren Dong, Fenghong Chu, Yuanhang Wang, Jinglin Li, Lu Zhang. Detection of Residual Organic Pesticides in Yam by Surface Enhanced Raman Spectroscopy[J]. Laser & Optoelectronics Progress, 2022, 59(4): 0417001 Copy Citation Text

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