• Infrared and Laser Engineering
  • Vol. 49, Issue 11, 20200261 (2020)
Xiangfeng Liu1, Genghua Huang1, Zhijie Zhang1, Fengxiang Wang1, and Rong Shu1、2、*
Author Affiliations
  • 1Key Laboratory of Space Active Opto-Electronics Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
  • 2School of Information Science and Technology, ShanghaiTech University, Shanghai 201210, China
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    DOI: 10.3788/IRLA20200261 Cite this Article
    Xiangfeng Liu, Genghua Huang, Zhijie Zhang, Fengxiang Wang, Rong Shu. Noise reduction based on empirical mode decomposition for full waveforms data of GaoFen-7 laser altimetry[J]. Infrared and Laser Engineering, 2020, 49(11): 20200261 Copy Citation Text show less

    Abstract

    The complex full waveforms from laser altimetry, mixed with high noise, are usually reflected by the object with multiple height elevations. To accurately analyze the decomposition, vertical structure and characteristic parameters from these waveforms, a noise reduction method based on empirical mode decomposition (EMD) was investigated and tested with the full waveform of nonlinear and nonstationary signals obtained by GaoFen-7 space-borne laser altimetry. The reconstruction of an effective waveform signal was implemented through reverse superimposition of its intrinsic mode functions (IMFs) and the residual. And then different selection methods for these IMFs were compared, such as removed high frequency, threshold, wavelet and detrended fluctuation analysis (DFA). The results show that EMD-DFA1 and EMD-1 IMF have a higher noise reduction effect on these full waveforms, followed by EMD-Wavelet and EMD-Threshold. Finally, EMD-DFA1 was performed on the full waveforms with single peak, mixed peaks and multiple peaks. And the results show that EMD-DFA1 does well adaptability.
    Xiangfeng Liu, Genghua Huang, Zhijie Zhang, Fengxiang Wang, Rong Shu. Noise reduction based on empirical mode decomposition for full waveforms data of GaoFen-7 laser altimetry[J]. Infrared and Laser Engineering, 2020, 49(11): 20200261
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