1Science and Technology on Electronic Test & Measurement Laboratory, The 41st Research Institute of CETC, Qingdao 266555, China
2School of Information Science & Engineering and Shandong Provincial Key Laboratory of Laser Technology and Application, Shandong University, Jinan 250100, China
3Institute of Applied Electronics, China Academy of Engineering Physics, Mianyang 621900, China
Fig. 1. Schematic layout of the double-pass grating imaging spectrometer. (a) Schematic of the present method; (b) simulation of the captured image by the proposed method with a snapshot; (c) simulation of the captured image obtained by the traditional grating imaging spectrometer with a snapshot.
Fig. 3. Result of the simulation system. (a) The input scene; (b) the captured color image of the scene in one shot; (c) the captured gray image of the scene in one shot.