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    Journals >Opto-Electronic Engineering >Volume 44 >Issue 7 >Page 744 > Article
    • Opto-Electronic Engineering
    • Vol. 44, Issue 7, 744 (2017)
    I-V characteristic test and curve fitting of high-altitude solar cell
    Yuyan Zhang1, Yong Liu1, Yintang Wen2, and Xiaoyuan Luo1
    Author Affiliations
  • 1Institute of Electrical Engineering, Yanshan University, Qinhuangdao 066004, China
  • 2Institute of Defense Science and Technology, Yanshan University, Qinhuangdao 066004, China
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    DOI: Cite this Article
    Yuyan Zhang, Yong Liu, Yintang Wen, Xiaoyuan Luo. I-V characteristic test and curve fitting of high-altitude solar cell[J]. Opto-Electronic Engineering, 2017, 44(7): 744 Copy Citation Text show less
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    Yuyan Zhang, Yong Liu, Yintang Wen, Xiaoyuan Luo. I-V characteristic test and curve fitting of high-altitude solar cell[J]. Opto-Electronic Engineering, 2017, 44(7): 744
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