• Spectroscopy and Spectral Analysis
  • Vol. 33, Issue 2, 468 (2013)
JIANG Lin*, ZHANG Da-wei, TAO Chun-xian, HUANG Yuan-shen, WANG Qi, NI Zheng-ji, and ZHUANG Song-lin
Author Affiliations
  • [in Chinese]
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    DOI: 10.3964/j.issn.1000-0593(2013)02-0468-03 Cite this Article
    JIANG Lin, ZHANG Da-wei, TAO Chun-xian, HUANG Yuan-shen, WANG Qi, NI Zheng-ji, ZHUANG Song-lin. Preparation by Spin-Coating Technology and Characterization of UV-Enhanced Lumogen Film[J]. Spectroscopy and Spectral Analysis, 2013, 33(2): 468 Copy Citation Text show less
    References

    [1] Li Flora M, Nathan A. CCD Image Sensors in Deep-Ultravioler: Degradation Behavior and Danage Mechanisms. Berlin: Springer, 2005. 38.

    [3] Franks W A R, Kiik M J. IEEE Transactions on Electron Devices, 2003, 50(2): 352.

    [5] Dasilva M V, Perea M F, Méndez J A, et al. Optics Express, 2009, 17(25): 22773.

    [6] Klampaftis E, Ross D, McIntosh K R, et al. Solar Energy Materials & Solar Cells, 2009, 93: 1183.

    [7] Xu Y F, Zhang H J, Chen Q, et al. Chinses Journal of Chemical Physics, 2006, 19(2): 152.

    [8] Kwon M S, Kim C J, et al. Journal of Materials Science, 2005, 40: 4089.

    [10] Kim I G, Park S, Kang S G, et al. Journal of Luminescence, 2010, 130: 1521.

    [11] Zhang J, Qu K, Yang X X. IEEE Electron Device Letter, 2009, 30(9): 1005.

    [12] Chen C Y, Yeh D M, Lu Y C. Applied Physics Letters, 2009, 89: 2031131.

    [13] Keough S J, Hanley T L, Wedding A B, et al. Surface Science, 2007, 601: 5744.

    CLP Journals

    [1] LIU Qiong, MA Shou-bao, QIAN Xiao-chen, RUAN Jun, LU Zhong-rong, TAO Chun-xian. Thickness Optimization and Photoelectric Performance Test of UV Sensitized Film of CMOS Sensor[J]. Acta Photonica Sinica, 2017, 46(6): 604002

    JIANG Lin, ZHANG Da-wei, TAO Chun-xian, HUANG Yuan-shen, WANG Qi, NI Zheng-ji, ZHUANG Song-lin. Preparation by Spin-Coating Technology and Characterization of UV-Enhanced Lumogen Film[J]. Spectroscopy and Spectral Analysis, 2013, 33(2): 468
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