Interferogram region spreading technology based on exemplar matching

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Infrared and Laser Engineering >Volume 36 >Issue 1 >Page 82 > Article

Infrared and Laser Engineering
Vol. 36, Issue 1, 82 (2007)

Interferogram region spreading technology based on exemplar matching

[in Chinese]^1、*, [in Chinese]², [in Chinese]², [in Chinese]², and [in Chinese]²

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¹[in Chinese]

²[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Interferogram region spreading technology based on exemplar matching[J]. Infrared and Laser Engineering, 2007, 36(1): 82 Copy Citation Text

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References

[1] ROD IER C,RODIER F.Interferogram analysis using Fourier transform technique[J].Applied Optics,1987,26(9):1668-1673.

[2] TALAMONTI J J,KAY R B,KREBS D J.Numerical model estimating the capabilities and limitations of the fast Fourier transform technique in absolute interferometry[J].Applied Optics,1996,35(13):2182-2191.

[3] BONE D J.Fourier fringe analysis:the two-dimension phase unwrapping problem[J].Applied Optics,1991,30(25):3627-3632.

[8] BONE D J,BACHOR H A,SANDEMAN R J.Fringe pattern analysis using a 2-D Fourier transform[J].Applied Optics,1986,25 (10):1653-1660.

[9] CRIMINISI A,PEREZ P,TOYAMA K.Object removal by exemplar-based inpainting[C]//Proceedings of IEEE Computer Society Conference on Computer Vision and Pattern Recognition,2003,2:721-728.

[10] FLYNN T J.Consistent 2-D phase unwrapping guided by a quality map[C]//Proceedings of the 1996 International Geomorphology and Remote Sensing Sym posium.Lincoln:IEEE,1996:2057-2059.

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Interferogram region spreading technology based on exemplar matching[J]. Infrared and Laser Engineering, 2007, 36(1): 82

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