Effect of rear surface fields on hot, refluxing and escaping electron populations via numerical simulations

D. R. Rusby; C. D. Armstrong; G. G. Scott; M. King; P. McKenna; D. Neely

doi:10.1017/hpl.2019.34

Journals >High Power Laser Science and Engineering >Volume 7 >Issue 3 >Page 03000e45 > Article

High Power Laser Science and Engineering
Vol. 7, Issue 3, 03000e45 (2019)

Effect of rear surface fields on hot, refluxing and escaping electron populations via numerical simulations

D. R. Rusby^1、†, C. D. Armstrong¹, G. G. Scott¹, M. King², P. McKenna², and D. Neely^1、2

Author Affiliations

¹Central Laser Facility, STFC, Rutherford Appleton Laboratory, Chilton, DidcotOX11 0QX, UK

²SUPA, Department of Physics, University of Strathclyde, Glasgow G4 0NG, UK

show less

DOI: 10.1017/hpl.2019.34 Cite this Article Set citation alerts

D. R. Rusby, C. D. Armstrong, G. G. Scott, M. King, P. McKenna, D. Neely. Effect of rear surface fields on hot, refluxing and escaping electron populations via numerical simulations[J]. High Power Laser Science and Engineering, 2019, 7(3): 03000e45 Copy Citation Text

EndNote(RIS)

BibTex

Plain Text

show less

Cited By

Article index updated: May. 3, 2024

Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.