[1] D. W. Pohl, W. Denk, and M. Lanz, Appl. Phys. Lett. 44, 651 (1984).
[2] A. Lewis, M. Isaacson, A. Harootunian, and A. Muray, Ultramicrosc. 13, 227 (1984).
[3] A. Bouhelier, J. Renger, M. R. Beversluis, and L. Novotny, J. Microscopy 210, 220 (2003).
[4] H. Frey, C. Bolwien, A. Brandenburg, R. Ros, and D. Anselmetti, Nanotechnology 17, 3105 (2006).
[5] L. Vaccaro, L. Aeschimann, U. Staufer, H. P. Herzig, and R. Dandliker, Appl. Phys. Lett. 83, 584 (2003).
[6] W. Chen and Q. Zhan, Proc. SPIE 6450, 64500D (2007).
[7] W. Chen and Q. Zhan, Opt. Express 15, 4106 (2007).
[8] Q. Zhan and J. R. Leger, Opt. Express 10, 324 (2002).