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    Journals >Chinese Optics Letters >Volume 5 >Issue 12 >Page 709 > Article
    • Chinese Optics Letters
    • Vol. 5, Issue 12, 709 (2007)
    Field enhancement analysis of an apertureless near field scanning optical microscope probe with finite element method
    Weibin Chen* and Qiwen Zhan
    Author Affiliations
  • Electro-Optics Graduate Program, University of Dayton, 300 College Park, Dayton, Ohio 45469-0245, USA
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    Weibin Chen, Qiwen Zhan. Field enhancement analysis of an apertureless near field scanning optical microscope probe with finite element method[J]. Chinese Optics Letters, 2007, 5(12): 709 Copy Citation Text show less
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    Article index updated: May. 19, 2024
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    Weibin Chen, Qiwen Zhan. Field enhancement analysis of an apertureless near field scanning optical microscope probe with finite element method[J]. Chinese Optics Letters, 2007, 5(12): 709
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    Paper Information
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