• Infrared and Laser Engineering
  • Vol. 46, Issue 4, 427001 (2017)
Wang Peng, Shi Ruize, Zhong Xiaofeng, and Sun Changku
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/irla201746.0427001 Cite this Article
    Wang Peng, Shi Ruize, Zhong Xiaofeng, Sun Changku. 3D scanning measurement system based on double-line projection and the line-plane constraint[J]. Infrared and Laser Engineering, 2017, 46(4): 427001 Copy Citation Text show less
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    Wang Peng, Shi Ruize, Zhong Xiaofeng, Sun Changku. 3D scanning measurement system based on double-line projection and the line-plane constraint[J]. Infrared and Laser Engineering, 2017, 46(4): 427001
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