High Reflectivity Measurement Based on the Intracavity Loss Scanning of Ring-Down Cavity

Zhongzhou Tian; Xing He; Shuai Wang; Ping Yang; Bing Xu

doi:10.3788/LOP220640

Journals >Laser & Optoelectronics Progress >Volume 60 >Issue 7 >Page 0712002 > Article

Laser & Optoelectronics Progress
Vol. 60, Issue 7, 0712002 (2023)

High Reflectivity Measurement Based on the Intracavity Loss Scanning of Ring-Down Cavity

Zhongzhou Tian^1、2、3, Xing He^{1、2、3、*}, Shuai Wang^1、2、3, Ping Yang^1、2、3, and Bing Xu^{1、2、3、**}

Author Affiliations

¹Key Laboratory on Adaptive Optics, Chinese Academy of Sciences, Chengdu 610209, Sichuan, China

²Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, Sichuan, China

³University of Chinese Academy of Sciences, Beijing 100049, China

show less

DOI: 10.3788/LOP220640 Cite this Article Set citation alerts

Zhongzhou Tian, Xing He, Shuai Wang, Ping Yang, Bing Xu. High Reflectivity Measurement Based on the Intracavity Loss Scanning of Ring-Down Cavity[J]. Laser & Optoelectronics Progress, 2023, 60(7): 0712002 Copy Citation Text

show less

Cited By

Article index updated: May. 19, 2024

Citation counts are provided from Researching.

The article is cited by 1 article(s) from Researching.

Download Citation

Set citation alerts for the article

Tools

Set citation alerts for the article

Save the article for my favorites

Paper Information