• Journal of Terahertz Science and Electronic Information Technology
  • Vol. 19, Issue 2, 338 (2021)
GUAN Xiaoming*, FANG Jian, LAI Rongxing, and LUO Yunzhong
Author Affiliations
  • [in Chinese]
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    DOI: 10.11805/tkyda2019526 Cite this Article
    GUAN Xiaoming, FANG Jian, LAI Rongxing, LUO Yunzhong. Design of a single event effects hardened input interface circuit[J]. Journal of Terahertz Science and Electronic Information Technology , 2021, 19(2): 338 Copy Citation Text show less
    References

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    [2] FAVALLI M,METRA C. TMR voting in the presence of crosstalk faults at the voter inputs[J]. IEEE Transactions on Reliability, 2004,53(3):342-348.

    [3] CALIN T,NICOLAIDIS M,VELAZCO R. Upset hardened memory design for submicron CMOS technology[J]. IEEE Transactions on Nuclear Science, 1996,43(6):2874-2878.

    [5] SHAH J S,SACHDEV M. Radiation hardened pulsed latches in 65 nm CMOS[C]// IEEE Canadian Conference on Electrical and Computer Engineering(CCECE). [S.1.]:IEEE, 2016:1-4.

    [6] TADROS R N,HUA W Z,MOREORA M T,et al. A low power low-area error-detecting latch for resilient architectures in 28 nm FDSOI[J]. IEEE Transactions on Circuits and SystemsⅡ:Express Brief, 2016,63(9):858-862.

    [7] UENO H,NAMBA K. Construction of a Soft Error(SEU) hardened latch with high critical charge[C]// IEEE International Symposium on Defect and Fault Tolerance(DFT) in VLSI and Nanotechnology Systems. [S.1.]:IEEE, 2016:27-30.

    GUAN Xiaoming, FANG Jian, LAI Rongxing, LUO Yunzhong. Design of a single event effects hardened input interface circuit[J]. Journal of Terahertz Science and Electronic Information Technology , 2021, 19(2): 338
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