Fig. 1. Schematic diagram of PSF construction process

Fig. 2. Schematic diagram of quantum efficiency of NOIP1SN5000A-D-type CMOS

Fig. 3. First-order diffraction efficiencies under different design wavelengths. (a) 460 nm; (b) 540 nm; (c) 610 nm

Fig. 4. Structural diagram of patent system

Fig. 5. MTF curve of patent system

Fig. 6. Structural diagram of optimized system

Fig. 7. MTF curve of optimized system

Fig. 8. Constructed R-channel PSF model. (a) Overall; (b) partial magnification

Fig. 9. Constructed G-channel PSF model. (a) Overall; (b) partial magnification

Fig. 10. Constructed B-channel PSF model. (a) Overall; (b) partial magnification

Fig. 11. Comparison of color image restoration results. (a) Image before restoration; (b) image after restoration; (c) partial magnification of image before restoration; (d) partial magnification of image after restoration

Fig. 12. Comparison of gray images of R, G, B channels before and after restoration. (a) Gray image of R channel before restoration; (b) gray image of R channel after restoration; (c) gray image of G channel before restoration; (d) gray image of G channel after restoration; (e) gray image of B channel before restoration; (f) gray image of B channel after restoration

Table 1. First-order diffraction efficiencies at specified wavelengths under different design wavelengths

Table 2. Parameters of patent system

Table 3. Image evaluation results