Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Opto-Electronic Engineering >Volume 44 >Issue 10 >Page 1027 > Article
    • Opto-Electronic Engineering
    • Vol. 44, Issue 10, 1027 (2017)
    Measurement of Si―OH content in fused silica with extended dynamic range by Fourier transform infrared spectroscopy
    Jiangning Zhou1 and Bincheng Li1、2
    Author Affiliations
  • 1Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China
  • 2School of Optoelectronic Information, University of Electronic and Science and Technology of China, Chengdu 610054, China
    • show less
    DOI: Cite this Article
    Jiangning Zhou, Bincheng Li. Measurement of Si―OH content in fused silica with extended dynamic range by Fourier transform infrared spectroscopy[J]. Opto-Electronic Engineering, 2017, 44(10): 1027 Copy Citation Text show less
    References
    Abstract
    Get PDF
    Figures&Tables (0)
    Equations (0)
    References (0)
    Get Citation
    Copy Citation Text
    Jiangning Zhou, Bincheng Li. Measurement of Si―OH content in fused silica with extended dynamic range by Fourier transform infrared spectroscopy[J]. Opto-Electronic Engineering, 2017, 44(10): 1027
    Download Citation
    Tools
    Share
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology