• Journal of Infrared and Millimeter Waves
  • Vol. 35, Issue 3, 326 (2016)
ZHENG Xing*, LIU Zi-Ji, GU De-En, GOU Jun, MA Jia-Feng, LI Wei-Zhi, and WU Zhi-Ming
Author Affiliations
  • [in Chinese]
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    DOI: 10.11972/j.issn.1001-9014.2016.03.013 Cite this Article
    ZHENG Xing, LIU Zi-Ji, GU De-En, GOU Jun, MA Jia-Feng, LI Wei-Zhi, WU Zhi-Ming. AOrthogonal design of multilayer thin film residual stress impact on the THz micro bridge deformation[J]. Journal of Infrared and Millimeter Waves, 2016, 35(3): 326 Copy Citation Text show less

    Abstract

    Residual stress matching is critical for elimination of deformation for terahertz (THz) microbolometer with micro-bridge structure. Finite element simulation model of micro-bridge was built with a pixel size of 35 μm×35 μm. Intellisuite was used for mechanics simulation based on orthogonal experimental design. A minimum deformation of 0.0385 μm was obtained with an optimized stress combination when the residual stresses of support layer, passivation layer, electrode layer, sensitive layer and absorption layer were +200 MPa, +200 MPa, +200 MPa, 0 MPa and -400 MPa, respectively. 320×240 THz focal plane array was fabricated with the optimized stress combination. A minimal deformation was achieved, which agreed well with the simulation.
    ZHENG Xing, LIU Zi-Ji, GU De-En, GOU Jun, MA Jia-Feng, LI Wei-Zhi, WU Zhi-Ming. AOrthogonal design of multilayer thin film residual stress impact on the THz micro bridge deformation[J]. Journal of Infrared and Millimeter Waves, 2016, 35(3): 326
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