Three-Dimensional Displacement Measurement in Electronic Speckle Pattern Interferometry by Using Reversed Phase Calculation

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Acta Optica Sinica >Volume 26 >Issue 2 >Page 193 > Article

Acta Optica Sinica
Vol. 26, Issue 2, 193 (2006)

Three-Dimensional Displacement Measurement in Electronic Speckle Pattern Interferometry by Using Reversed Phase Calculation

[in Chinese]^1、*, [in Chinese]², [in Chinese]¹, [in Chinese]¹, [in Chinese]¹, and [in Chinese]¹

Author Affiliations

¹[in Chinese]

²[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Three-Dimensional Displacement Measurement in Electronic Speckle Pattern Interferometry by Using Reversed Phase Calculation[J]. Acta Optica Sinica, 2006, 26(2): 193 Copy Citation Text

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References

[1] Jingwei Tong, Dongsheng Zhang, Hongqi Li et al.. Automatic analysis of three-dimensional displacemnet field using ESPI[J]. Opt. and Lasers in Engng., 1997, 26(6): 515～529

[6] P. K. Rastogi. Digital Speckle Pattern Interferometry and Related Techniques[M]. England: John Wiley & Sons Ltd, 2001

[7] H. A. Vrooman, Ad A. M. Maas. Image processing algorithms for the analysis of phase-shifted speckle interference patterns[J]. Appl. Opt., 1991, 30(13): 1636～1641

[9] J. N. Petzing, J. R. Tyrer. Recent development and applications in electronic speckle pattern interferometry[J]. J. of Strain Analysis, 1998, 33(2): 153～169