The one-dimensional orderly nano-corrugation of magnetic quadrilayer thin film was fabricated by means of interference lithography (IL) and magnetron sputtering techniques. Scanning probe microscope (SPM) was used to characterize morphologies of the samples. The magneto-optical Kerr effect (MOKE) and optical parameters measurement were performed with a homemade MOKE system and ellipsometry (ELLIP-A), respectively. The experimental results show that the magneto-optical Kerr signal of the nanostructure is significantly enhanced, the Kerr peak is connected with the stripe width and the thickness of intermediate HfO2 layer, and the magneto-optical properties of the corrugated magnetic thin film can be tuned by the thickness of the intermediate HfO2 layer. Furthermore, the enhancement of transverse magneto-optical Kerr effect is observed. The theoretical calculations show that the magneto-optical Kerr enhancement of the system can be manipulated significantly by the coupling between plasmon resonance and cavity effect.