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    Journals >Acta Optica Sinica >Volume 35 >Issue 6 >Page 631002 > Article
    • Acta Optica Sinica
    • Vol. 35, Issue 6, 631002 (2015)
    Analysis of Amorphous Silicon Passivation Layer in Heterojunction Solar Cells by Spectroscopic Ellipsometry
    Guo Wanwu1、2、3、*, Zhang Liping1, Bao Jian2, Meng Fanying1, Chen Yifeng2, Feng Zhiqiang2, and Liu Zhengxin1、3
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.3788/aos201535.0631002 Cite this Article Set citation alerts
    Guo Wanwu, Zhang Liping, Bao Jian, Meng Fanying, Chen Yifeng, Feng Zhiqiang, Liu Zhengxin. Analysis of Amorphous Silicon Passivation Layer in Heterojunction Solar Cells by Spectroscopic Ellipsometry[J]. Acta Optica Sinica, 2015, 35(6): 631002 Copy Citation Text show less
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    Guo Wanwu, Zhang Liping, Bao Jian, Meng Fanying, Chen Yifeng, Feng Zhiqiang, Liu Zhengxin. Analysis of Amorphous Silicon Passivation Layer in Heterojunction Solar Cells by Spectroscopic Ellipsometry[J]. Acta Optica Sinica, 2015, 35(6): 631002
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