A Novel Long-scanning Surface Instrument Design Using a Zeeman 2-f requency Laser

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Acta Optica Sinica >Volume 11 >Issue 4 >Page 294 > Article

Acta Optica Sinica
Vol. 11, Issue 4, 294 (1991)

A Novel Long-scanning Surface Instrument Design Using a Zeeman 2-f requency Laser

[in Chinese]¹, [in Chinese]¹, [in Chinese]², and [in Chinese]²

Author Affiliations

¹Instrumentation Division, Brookhaven National Laboratory, Upton, NY.11973, U.S.A

²[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. A Novel Long-scanning Surface Instrument Design Using a Zeeman 2-f requency Laser[J]. Acta Optica Sinica, 1991, 11(4): 294 Copy Citation Text

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References

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. A Novel Long-scanning Surface Instrument Design Using a Zeeman 2-f requency Laser[J]. Acta Optica Sinica, 1991, 11(4): 294

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