• Laser & Optoelectronics Progress
  • Vol. 48, Issue 2, 23103 (2011)
Peng Hua1、*, Xia Zhilin1, Xue Yiyu1、2, Guo Peitao2, Fu Zhiwei1, and Zhao Lixin1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/lop48.023103 Cite this Article Set citation alerts
    Peng Hua, Xia Zhilin, Xue Yiyu, Guo Peitao, Fu Zhiwei, Zhao Lixin. Effect of N, N-Dimethylformamide on Structure and Optical Properties of Porous Silica Film[J]. Laser & Optoelectronics Progress, 2011, 48(2): 23103 Copy Citation Text show less

    Abstract

    Using a base catalysis for the hydrolysis of tetraethyl orthosilicate (TEOS), porous silica antireflective film are prepared by in-situ sol-gel process and normal atmosphere drying with the introduction of N, N-dimethylformamide (DMF). Thermal stability in drying process of the SiO2 sol is studied by Netzsch thermal analyzer; the structure and morphology of these samples are characterized by scanning electron microscope (SEM); the effect on optical properties of porous silicon thin films are measured by spectrophotometer. The results show that DMF effectively prevents the gel from cracking and inhibits the formation of particle clusters, which makes silica particles form a network and prepare silica films easily. DMF can also improve the transmittance of film higher than 99% in 300~1000 nm region.
    Peng Hua, Xia Zhilin, Xue Yiyu, Guo Peitao, Fu Zhiwei, Zhao Lixin. Effect of N, N-Dimethylformamide on Structure and Optical Properties of Porous Silica Film[J]. Laser & Optoelectronics Progress, 2011, 48(2): 23103
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