[1] J. P. Kirk and C. J. Plogler, Proc. SPIE 3679, 70 (1999).

[2] H. Nomra, K. Tawarayama, and T. Kohno, Proc. SPIE 3679, 358 (1999).

[3] J. P. Kirk, Proc. SPIE 4000, 2 (2000).

[4] J. P. Kirk, G. Kunkel, and A. K. Wong, Proc. SPIE 4346, 8 (2001).

[5] H. Nomra, Proc. SPIE 4346, 25 (2001).

[6] T. Hagiwara, N. Kondo, I. Hiroshi, K. Suzuki, and N. Magome, Proc. SPIE 5754, 1659 (2005).

[7] F. Wang, H. Lu, Q. Zhang, and A. Y. Bourov, Chin. Opt. Lett. (to be published).

[8] L. Zavyalova, A. Bourov, and B. W. Smith, Proc. SPIE 5754, 1728 (2005).

[9] W. Liu, S. Liu, T. Zhou, and L. Wang, Opt. Express 17, 19278 (2009).

[10] L. Duan, X. Wang, A. Y. Bourov, B. Peng, and P. Bu, Opt. Express 19, 18080 (2011).

[11] L. Duan, X. Wang, G. Yan, and A. Y. Bourov, Proc. SPIE 8169, 816909 (2011).

[12] A. Y. Bourov, L. Li, Z. Yang, F. Wang, and L. Duan, Proc. SPIE 7640, 764032 (2010).

[13] G. E. P. Box and D. W. Behnken, Technometrics 2, 455 (1960).

[14] T. J. Robinson, Box–Behnken Designs Encyclopedia of Statistics in Quality and Reliability (Wiley, New Work, 2008).

[15] C. A. Mack, Proc. SPIE 5645, 63 (2005).

[16] C. A. Mack, Proc. SPIE 5754, 1 (2004).