In situ aberration measurement technique based on multi-illumination settings and principal component analysis of aerial images

Dongbo Xu; Xiangzhao Wang; Yang Bu; Lifeng Duan; Guanyong Yan; Jishuo Yang; Anatoly Y.

doi:10.3788/col201210.121202

Journals >Chinese Optics Letters >Volume 10 >Issue 12 >Page 121202 > Article

Chinese Optics Letters
Vol. 10, Issue 12, 121202 (2012)

In situ aberration measurement technique based on multi-illumination settings and principal component analysis of aerial images

Dongbo Xu, Xiangzhao Wang, Yang Bu, Lifeng Duan, Guanyong Yan, Jishuo Yang, and Anatoly Y.

DOI: 10.3788/col201210.121202 Cite this Article Set citation alerts

Dongbo Xu, Xiangzhao Wang, Yang Bu, Lifeng Duan, Guanyong Yan, Jishuo Yang, Anatoly Y.. In situ aberration measurement technique based on multi-illumination settings and principal component analysis of aerial images[J]. Chinese Optics Letters, 2012, 10(12): 121202 Copy Citation Text

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