• Opto-Electronic Engineering
  • Vol. 47, Issue 2, 190331 (2020)
Lv Qinghua1、2、*, Cheng Zhuang3, Zhai Zhongsheng3, Wang Xuanze3, Cui Jiachen1、2, and Lv Hui1、2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.12086/oee.2020.190331 Cite this Article
    Lv Qinghua, Cheng Zhuang, Zhai Zhongsheng, Wang Xuanze, Cui Jiachen, Lv Hui. 3-DOF measurement method for non-diffracting Moiré fringes based on CGH[J]. Opto-Electronic Engineering, 2020, 47(2): 190331 Copy Citation Text show less
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    [14] Kroll J J. Six degree of freedom optical sensor for dynamic measurement of linear axes[D]. Charlotte: University of North Carolina at Charlotte, 2003.

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    [17] Hsieh H L, Pan S W. Three-degree-of-freedom displacement measurement using grating-based heterodyne interferometry[J]. Applied Optics, 2013, 52(27): 6840–6848.

    [18] Kim JW, Kang C S, Kim J A, et al. A compact system for si-multaneous measurement of linear and angular displacements of nano-stages[J]. Optics Express, 2007, 15(24): 15759–15766.

    Lv Qinghua, Cheng Zhuang, Zhai Zhongsheng, Wang Xuanze, Cui Jiachen, Lv Hui. 3-DOF measurement method for non-diffracting Moiré fringes based on CGH[J]. Opto-Electronic Engineering, 2020, 47(2): 190331
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